Surface X-ray diffraction studies of CaF2(110)/Si(001) interface formation
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چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations of Crystallography
سال: 2008
ISSN: 0108-7673
DOI: 10.1107/s0108767308082147